Brian Bailey. Can Mutation Analysis Help Fix Our Broken Coverage Metrics?. In Hana Chockler, Alan J. Hu, editors, Hardware and Software: Verification and Testing, 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008. Proceedings. Volume 5394 of Lecture Notes in Computer Science, pages 5, Springer, 2008. [doi]
Abstract is missing.