Abstract is missing.
- A report on a survey and study of static analysis usersNathaniel Ayewah, William Pugh. 1-5 [doi]
- Predicting fault-prone modules based on metrics transitionsYoshiki Higo, Kenji Murao, Shinji Kusumoto, Katsuro Inoue. 6-10 [doi]
- Exploring the relationship of history characteristics and defect count: an empirical studyTimea Illes-Seifert, Barbara Paech. 11-15 [doi]
- Can data transformation help in the detection of fault-prone modules?Yue Jiang, Bojan Cukic, Tim Menzies. 16-20 [doi]
- The impact of product development on the lifecycle of defectsRudolf Ramler. 21-25 [doi]
- Nearest neighbor sampling for cross company defect predictors: abstract onlyBurak Turhan, Ayse Basar Bener, Tim Menzies. 26 [doi]
- Comparing methods to identify defect reports in a change management databaseElaine J. Weyuker, Thomas J. Ostrand. 27-31 [doi]
- SZZ revisited: verifying when changes induce fixesChadd C. Williams, Jaime Spacco. 32-36 [doi]
- A criterion for filtering code clone related bugsYasuhiro Hayase, Yii Yong Lee, Katsuro Inoue. 37-38 [doi]
- Defect classification and defect types revisitedStefan Wagner. 39-40 [doi]
- Retrieving similar code fragments based on identifier similarity for defect detectionNorihiro Yoshida, Takashi Ishio, Makoto Matsushita, Katsuro Inoue. 41-42 [doi]
- Do bad smells indicate trouble in code?Min Zhang, Tracy Hall, Nathan Baddoo, Paul Wernick. 43-44 [doi]