Patrick Juliano - researchr alias

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Viewing Publication 1 - 3 from 3

2001

Measurement, Modeling, and Simulation of Fast Transients in ESD DevicesPatrick Juliano. PhD thesis, University of Illinois Urbana-Champaign, USA, 2001. [doi]

Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuitsYu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum. mr, 41(11):1781-1787, 2001. [doi]

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditionsJie Wu, Patrick Juliano, Elyse Rosenbaum. mr, 41(11):1771-1779, 2001. [doi]

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