Sheng-Tsaing Tseng - researchr alias

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Viewing Publication 1 - 20 from 20

2023

Neural ordinary differential equation for sequential optimal design of fatigue test under accelerated life test analysisMarzieh Khakifirooz, Michel Fathi, I-Chen Lee, Sheng-Tsaing Tseng. ress, 235:109242, July 2023. [doi]

2020

Model Misspecification of Generalized Gamma Distribution for Accelerated Lifetime-Censored DataMarzieh Khakifirooz, Sheng-Tsaing Tseng, Mahdi Fathi. technometrics, 62(3):357-370, 2020. [doi]

2019

Stability conditions and robustness analysis of a general MMSE run-to-run controllerSheng-Tsaing Tseng, Fugee Tsung, Jo-Hua Wu. iiset, 51(11):1279-1287, 2019. [doi]

2018

Sequential Bayesian Design for Accelerated Life TestsI-Chen Lee, Yili Hong 0001, Sheng-Tsaing Tseng, Tirthankar Dasgupta. technometrics, 60(4):472-483, 2018. [doi]

2017

A Generalized Quasi-MMSE Controller for Run-to-Run Dynamic ModelsSheng-Tsaing Tseng, Pei-yu Chen. technometrics, 59(3):381-390, 2017. [doi]

2016

Optimum Allocation Rule for Accelerated Degradation Tests With a Class of Exponential-Dispersion Degradation ModelsSheng-Tsaing Tseng, I-Chen Lee. technometrics, 58(2):244-254, 2016. [doi]

A Multivariate EWMA Controller for Linear Dynamic ProcessesSheng-Tsaing Tseng, Hsin-Chao Mi, I-Chen Lee. technometrics, 58(1):104-115, 2016. [doi]

2015

Adaptive Warranty Prediction for Highly Reliable ProductsNan-Jung Hsu, Sheng-Tsaing Tseng, Ming-Wei Chen. tr, 64(3):1057-1067, 2015. [doi]

2013

Statistical Lifetime Inference With Skew-Wiener Linear Degradation ModelsChien Yu Peng, Sheng-Tsaing Tseng. tr, 62(2):338-350, 2013. [doi]

2012

Optimal Design for Degradation Tests Based on Gamma Processes With Random EffectsChih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan. tr, 61(2):604-613, 2012. [doi]

2011

Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation ProcessChih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan. tr, 60(1):234-245, 2011. [doi]

2010

Fault Detection based on Statistical Multivariate Analysis and Microarray-type VisualizationMing-da Ma, David Shan-Hill Wong, Shi-Shang Jang, Sheng-Tsaing Tseng. tii, 6(1):18-24, 2010. [doi]

Progressive-Stress Accelerated Degradation Test for Highly-Reliable ProductsChien Yu Peng, Sheng-Tsaing Tseng. tr, 59(1):30-37, 2010. [doi]

2009

Mis-Specification Analysis of Linear Degradation ModelsChien Yu Peng, Sheng-Tsaing Tseng. tr, 58(3):444-455, 2009. [doi]

A Technical Note on "Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average Controller"Sheng-Tsaing Tseng, Bo-Yan Jou. technometrics, 51(3):335-338, 2009. [doi]

Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation ProcessesSheng-Tsaing Tseng, Narayanaswamy Balakrishnan, Chih-Chun Tsai. tr, 58(4):611-618, 2009. [doi]

2007

Sample Size Determination for Achieving Stability of Double Multivariate Exponentially Weighted Moving Average ControllerSheng-Tsaing Tseng, Jen Tang, Chien-Hua Lin. technometrics, 49(4):409-419, 2007. [doi]

2006

Optimal design for step-stress accelerated degradation testsChen-Mao Liao, Sheng-Tsaing Tseng. tr, 55(1):59-66, 2006. [doi]

2000

Optimal production run length for products sold with warrantyRuey Huei Yeh, Wen-Tsung Ho, Sheng-Tsaing Tseng. eor, 120(3):575-582, 2000. [doi]

1992

Use of variable range in solving multiple criteria scheduling problemsChing-Jong Liao, Rong-Hwa Huang, Sheng-Tsaing Tseng. cor, 19(5):453-460, 1992. [doi]

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