Thomas J. Witt - researchr alias

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Viewing Publication 1 - 8 from 8

2011

Allan Variance Analysis of Josephson Voltage Standard Comparison for Data Taken at Unequal Time IntervalsYi-Hua Tang, Stéphane Solve, Thomas J. Witt. tim, 60(7):2248-2254, 2011. [doi]

2007

The BIPM Watt BalanceAlain Picard, Michael Stock, Hao Fang, Thomas J. Witt, Dominique Reymann. tim, 56(2):538-542, 2007. [doi]

2005

Investigations of noise in measurements of electronic voltage standardsThomas J. Witt, Yi-Hua Tang. tim, 54(2):567-570, 2005. [doi]

Allan variances and spectral densities for DC voltage measurements with polarity reversalsThomas J. Witt. tim, 54(2):550-553, 2005. [doi]

2001

Recent developments in BIPM voltage standard comparisonsDominique Reymann, Thomas J. Witt, Peter Vrabcek, Yi-Hua Tang, Clark A. Hamilton, Alexander S. Katkov, Blaise Jeanneret, O. Power. tim, 50(2):206-209, 2001. [doi]

Using the Allan variance and power spectral density to characterize DC nanovoltmetersThomas J. Witt. tim, 50(2):445-448, 2001. [doi]

1999

A three-way, on-site comparison of the 10 V Josephson voltage standards of the PTB, the SP, and the BIPMDominique Reymann, Thomas J. Witt, Gunnar Eklund, Hannu Pajander, Håkan Nilsson, Ralf Behr, Torsten Funck, Franz Müller. tim, 48(2):257-261, 1999. [doi]

Pressure coefficients of some Zener diode-based electronic voltage standardsThomas J. Witt. tim, 48(2):329-332, 1999. [doi]

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