External Links

    Journal: IEEE Computer

    Volume 10, Issue 7

    12 -- 13Matthew F. Slana. Semiconductor Memories: New Dimensions in Storage Technology [Guest editor's introduction]
    14 -- 17Jeffery F. Gunn, D. J. Lynes, Robert L. Pritchett. A Bipolar 16K ROM Utilizing Schottky Diode Cells
    18 -- 25G. Panigrahi. The Implications of Electronic Serial Memories
    26 -- 30Walter T. Greenwood Jr.. Reliability Testing for Industrial Use
    32 -- 35Vason P. Srini. API Tests for RAM Chips
    37 -- 39Matthew F. Slana. Workshop Report: A Computer Element Technology Update
    42 -- 51Edward F. Miller Jr.. Special Feature Program Testing: Art Meets Theory
    52 -- 60Donald J. Reifer, Stephen Trattner. Special Feature a Glossary of Software Tool and Techniques
    64 -- 70William L. Spetz. Microsystems Microprocessor Networks
    71 -- 73Portia Isaacson. Microsystems Personal Computing Dissected (there's a Piece for Everyone)
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