Journal: IEEE Computer

Volume 7, Issue 1

9 -- 12Arthur J. Collmeyer. Developments in design automation
13 -- 20Attila Tóth, Chip Holt. Automated database-driven digital testing
21 -- 28Roland L. Mattison. Design automation of MOS artwork
29 -- 33Simon Wieczner. Interactive graphics in design automation
34 -- 36Sigurd Waaben, George C. Feth. LSI microprocessing workshop summary
37 -- 46David J. Kuck, Paul P. Budnik, Shyh-Ching Chen, Duncan H. Lawrie, Ross A. Towle, Richard E. Strebendt, Edward W. Davis, Joseph Han, Paul W. Kraska, Yoichi Muraoka. Measurements of parallelism in ordinary FORTRAN programs