External Links

    Journal: Computer Standards & Interfaces

    Volume 19, Issue 3-4

    173 -- 188Pasquale Arpaia, Harald Schumny. International standardization of ADC-based measuring systems - state of the art
    189 -- 203Alan J. Davis, Godi Fischer. Behavioral modeling of delta-sigma modulators
    205 -- 212Andrzej Pacut, Konrad Hejn. Equivalence of Widrow s and Gray s approaches to uniform quantizers
    213 -- 218Arvid Breitenbach. Determining figures of merit from analog-to-digital converter output spectra
    219 -- 229Nicola Giaquinto, Mario Savino, Amerigo Trotta. Metrological qualification of data acquisition systems
    231 -- 236Diego Bellan, Arnaldo Brandolini, Luca di Rienzo, Alessandro Gandelli. Improved definition of the effective number of bits in ADC testing
    runs on