1 | -- | 2 | A. Cruz Serra. Introduction to the special issue on ADC testing, 6th EuroWorkshop on ADC Modelling and Testing |
3 | -- | 13 | Andrzej Pacut, Konrad Hejn. Reference properties of uniform quantizers - comparison of Widrow s and direct approaches |
15 | -- | 22 | Pasquale Arpaia, Pasquale Daponte, Sergio Rapuano. Characterization of digitizer timebase jitter by means of the Allan variance |
23 | -- | 31 | M. Fonseca da Silva, A. Cruz Serra. New methods to improve convergence of sine fitting algorithms |
33 | -- | 44 | D. Mirri, G. Pasini, P. A. Traverso, F. Filicori, G. Iuculano. A finite-memory discrete-time convolution approach for the nonlinear dynamic modelling of S/H-ADC devices |
45 | -- | 55 | Ján Saliga, Linus Michaeli. Software for metrological characterisation of PC sound cards |
57 | -- | 63 | Vladimír Haasz, Harald Schumny. Some aspects of standardising performance characteristics for modular data acquisition systems |