- Scott Davidson 0001. On the Origin of AI Species. IEEE Design & Test of Computers, 43(1):90, February 2026.
- Biswajit Ray, Shyam Raghunathan, Sudeep Pasricha. Special Issue on Emerging Challenges With 3-D NAND Flash Storage. IEEE Design & Test of Computers, 43(1):5-6, February 2026.
- Cristian Zambelli, Rino Micheloni. Addressing the Cross-Temperature Issue in 3-D NAND Flash Memories: Characterization and Mitigation for Solid-State Drives. IEEE Design & Test of Computers, 43(1):30-40, February 2026.
- Hajime Sano, Hitomi Tanaka, Reika Ichihara, Yuta Aiba, Kazuma Hasegawa, Chieko Tokunaga, Tatsuya Watanabe, Yasuhito Yoshimizu, Tomoya Sanuki. Circular SSDs Enabled by Recoverable 3-D Flash Memory. IEEE Design & Test of Computers, 43(1):23-29, February 2026.
- Zong-Si Wu, Jenq-Shiou Leu. SoC-GPIO-Based Dynamic Power Noise Control for Video Sensor Applications. IEEE Design & Test of Computers, 43(1):72-82, February 2026.
- Tei-Wei Kuo, Andy D. Pimentel, Yuan-Hao Chang 0001, Jen-Wei Hsieh. Report on the 2025 Embedded Systems Week (ESWEEK). IEEE Design & Test of Computers, 43(1):87-89, February 2026.
- Kapil Dev, Jerald Yoo, Younghyun Kim 0001, Srividhya Venkataraman. Celebrating Three Decades of IEEE/ACM International Symposium on Low Power Electronics and Design. IEEE Design & Test of Computers, 43(1):83-86, February 2026.
- Biswajit Ray, Shyam Raghunathan, Sudeep Pasricha. Reliability, Security, and Sustainability Challenges in 3-D NAND Flash SSDs. IEEE Design & Test of Computers, 43(1):7-22, February 2026.
- Hyeunjoo Kim, Sanghun Oh, Jaeyong Lee 0004, Jihong Kim 0001. Lazy Discharge: A High- Speed Energy-Efficient Read Technique for NAND Flash Memory. IEEE Design & Test of Computers, 43(1):49-57, February 2026.
- Po-Kai Hsu, Weihong Xu, Minji Shon, Zijian Zhao 0001, Kai Ni 0004, Tajana Rosing, Shimeng Yu. 3-D Ferroelectric NAND In-Storage Processing Architecture for Mass Spectrometry. IEEE Design & Test of Computers, 43(1):41-48, February 2026.