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- Ali Keshavarzi, Wilbert van den Hoek. Edge Intelligence - On the Challenging Road to a Trillion Smart Connected IoT Devices. IEEE Design & Test of Computers, 36(2):41-64, 2019.
- Seetal Potluri, Paul Pop, Jan Madsen. Design-for-Testability of On-Chip Control in mVLSI Biochips. IEEE Design & Test of Computers, 36(1):48-56, 2019.
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- Jae-woong Jeong, Jennifer Kitchen, Sule Ozev. On-Chip RF Phased Array Characterization with DC-Only Measurements for In-Field Calibration. IEEE Design & Test of Computers, 36(3):117-125, 2019.
- An Chen, Supriyo Datta, Xiaobo Sharon Hu, Michael T. Niemier, Tajana Simunic Rosing, J. Joshua Yang. A Survey on Architecture Advances Enabled by Emerging Beyond-CMOS Technologies. IEEE Design & Test of Computers, 36(3):46-68, 2019.
- Luis Pizano-Escalante, Omar Longoria-Gandara, Ramón Parra-Michel, F. Peña-Campos. Simulation Model to Predict BER Based on S-Parameters of High-Speed Interconnects. IEEE Design & Test of Computers, 36(1):31-39, 2019.
- Nikhil Rangarajan, Satwik Patnaik, Johann Knechtel, Ozgur Sinanoglu, Shaloo Rakheja. Spin-Based Reconfigurable Logic for Power- and Area-Efficient Applications. IEEE Design & Test of Computers, 36(3):22-30, 2019.
- Jörg Henkel. From the EIC: Architecture Advances Enabled by Emerging Technologies. IEEE Design & Test of Computers, 36(3):4, 2019.
- Emanuele Valea, Mathieu Da Silva, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre. A Survey on Security Threats and Countermeasures in IEEE Test Standards. IEEE Design & Test of Computers, 36(3):95-116, 2019.