IEICE Electronic Express - researchr journal

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Jiyao Yang, Hao Yang, Xing Yang, Jiansheng Yang. Optimal design of digital FIR filters based on back propagation neural network. IEICE Electronic Express, 20(1):20220491, 2023.
Yan Ding, Xiaoxin Liang, Yuepeng Yan, Xiao Wang. Design and comprehensive analysis of a novel structure of ARCL-to-SCL GSG transition for millimeter wave applications. IEICE Electronic Express, 20:20220526, 2023.
Jihu Liang, Ke Wang 0034, Wei Xi, Changbao Xu, Junjian Chen, Kai Huang 0002. SILL: Preventing structural attack for logic locking. IEICE Electronic Express, 20(2):20220512, 2023.
Jiazhe Li, Rui Li, Huanting Lu. A realization of super-fast scanning power supply for proton therapy. IEICE Electronic Express, 20(2):20210501, 2023.
Gui-Ying Liu, Wei-Jun Chen, Min Zhao. An efficient ADE-WLP-FDTD method with new WLPs and factorized splitting scheme for dispersive simulation. IEICE Electronic Express, 20(1):20220473, 2023.
Koken Fukushima, Makoto Okano, Atsushi Wada, Satoshi Tanaka, Fumihiko Ito. EDF laser displacement sensor based on bending characteristics of polarization-independent double-pass cascaded-chirped long-period fiber grating. IEICE Electronic Express, 20(2):20220496, 2023.
Kazuhiro Fujita. Impedance modeling of accelerator beams with discontinuous charge density using scattered-field physics-informed neural networks. IEICE Electronic Express, 20:20220523, 2023.
Jie Yang, Shenwang Li, Thomas Wu, Xuesong Li, Jingwei Zhang, Junyong Yu, GuangYu Zeng, Houqing Tang, DongDong Zhang. Research on temperature drift of tunneling magnetoresistance sensor based on proportional relationship and MacLaurin's series. IEICE Electronic Express, 20(2):20220486, 2023.
Erratum:A 240μW 17bit ENOB ΔΣ modulator using 2nd-order noise-shaped integrating quantizer [IEICE Electronics Express Vol. 19 (2022) No. 5 pp. 20220038]. IEICE Electronic Express, 20(1):20228001, 2023.
Jinzhi Lai, Jueping Cai, Jie Chu. A congestion-aware hybrid SRAM and STT-RAM buffer design for network-on-chip router. IEICE Electronic Express, 20(2):20220078, 2023.

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