- Changmo Yeo, Sang-Uk Cheon, Duhwan Mun. Manufacturability evaluation of parts using descriptor-based machining feature recognition. Int. J. Computer Integrated Manufacturing, 34(11):1196-1222, 2021.
- Yousef Haddad, Konstantinos Salonitis, Christos Emmanouilidis. Design of redistributed manufacturing networks: a model-based decision-making framework. Int. J. Computer Integrated Manufacturing, 34(10):1011-1030, 2021.
- Vishwesh Singbal, Gajendra Kumar Adil. Designing an automated storage/retrieval system with a single aisle-mobile crane under three new turnover based storage policies. Int. J. Computer Integrated Manufacturing, 34(2):212-226, 2021.
- Xinyu Li, Ming Li, Yongfei Wu, Daoxiang Zhou, Tianyu Liu, Fang Hao, Junhong Yue, Qiyue Ma. Accurate screw detection method based on faster R-CNN and rotation edge similarity for automatic screw disassembly. Int. J. Computer Integrated Manufacturing, 34(11):1177-1195, 2021.
- Hossein Gohari, Hossam A. Kishawy, Ahmad Barari. Adaptive variable layer thickness and perimetral offset planning for layer-based additive manufacturing processes. Int. J. Computer Integrated Manufacturing, 34(9):964-974, 2021.
- Tian Wang 0002, Jiakun Li, Yingjun Deng, Chuang Wang, Hichem Snoussi, Fei Tao. Digital twin for human-machine interaction with convolutional neural network. Int. J. Computer Integrated Manufacturing, 34(7-8):888-897, 2021.
- Zhengtuo Wang, Yuetong Xu, Jiongyan Yu, Guanhua Xu, Jianzhong Fu, Tianyi Gu. Instance segmentation of point cloud captured by RGB-D sensor based on deep learning. Int. J. Computer Integrated Manufacturing, 34(9):950-963, 2021.
- Radu Dobrescu, Stefan Mocanu, Oana Chenaru, Maximilian Nicolae, Gheorghe Florea. Versatile edge gateway for improving manufacturing supply chain management via collaborative networks. Int. J. Computer Integrated Manufacturing, 34(4):407-421, 2021.
- Todd J. B. Blayone, Roland vanOostveen. Prepared for work in Industry 4.0? Modelling the target activity system and five dimensions of worker readiness. Int. J. Computer Integrated Manufacturing, 34(1):1-19, 2021.
- FaJun Yang, Naiqi Wu, Yan Qiao, Rong Su, Chunjiang Zhang. Wafer sojourn time fluctuation analysis for time-constrained dual-arm multi-cluster tools with activity time variation. Int. J. Computer Integrated Manufacturing, 34(7-8):734-751, 2021.