| 2 | -- | 0 | J. Max Cortner, Giuseppe A. Fabrizio. President's message: Welcome to IEEE AUTOTESTCON 2019 |
| 3 | -- | 9 | Tzila Ajamian, Saïd Moussaoui, Antoine Dupret. Breaking nyquist limitations in reflectometry-based wire diagnosis systems by compressive sampling |
| 10 | -- | 21 | Josselyn Webb, Anthony Southern. Data collection for disconnected diagnostics in a net-centric environment |
| 22 | -- | 28 | Michael Fluet, Pavel Gilenberg. Test challenges of multi-gigabit serial buses |
| 29 | -- | 31 | Richard S. Davis. Basic metrology: It's elementary |
| 32 | -- | 37 | Russell Shannon, Gregory Zucaro, Justin Tallent, Vontrelle Collins, John Carswell. A system for detecting failed electronics using acoustics |
| 38 | -- | 47 | Randal Bailey, Charles Morris. Managing factory test content in risk adverse industries |
| 48 | -- | 49 | Lorenzo Ciani. Future trends in I&M: Diagnostics, maintenance and condition monitoring for cyber-physical systems |
| 50 | -- | 57 | Eulalia Balestrieri, Francesco Picariello, Sergio Rapuano, Ioan Tudosa. The jitter measurement ways: The jitter graphs |
| 59 | -- | 60 | Vincenzo Marletta. Life after graduation: Development of an automatic measurement system: A lab experience |
| 61 | -- | 65 | Robert Goldberg. Newproducts |
| 66 | -- | 67 | Alain Pegatoquet. Society news: SAS 2019 |