Journal: IEEE Instrum. Meas. Mag.

Volume 22, Issue 6

2 -- 0Bruno Andò. Editorial: Hot I&M topics in the IoT framework
3 -- 0Ricardo Jardim-Gonçalves. Guest editorial: Instrumentation and measurement in the Internet-of-Things
4 -- 10Edinei Santin, Luís B. Oliveira, João Goes. Built-in self test of high speed analog-to-digital converters
11 -- 17Boon-Yaik Ooi, Zan-Wai Kong, Wai-Kong Lee, Soung-Yue Liew, Shervin Shirmohammadi. A collaborative IoT-gateway architecture for reliable and cost effective measurements
18 -- 26Meisu Zhong, Yongsheng Yang, Haiqing Yao, Xiuwen Fu, Octavia A. Dobre, Octavian Postolache. 5G and IoT: Towards a new era of communications and measurements
27 -- 32Kun Xia, Hua Su, Jiawen Ni, Bangzheng Liu, Yanghong Ye, Han Li. Smart pen-shaped digital multimeter system based on IoT and cloud
33 -- 34Richard Nelson. Future trends in I&M: Industrial strength security
35 -- 44Giovanni Betta, Gianni Cerro, Marco Ferdinandi, Luigi Ferrigno, Mario Molinara. Contaminants detection and classification through a customized IoT-based platform: A case study
45 -- 52Fernando Luis-Ferreira, Zamiri Majid, João Sarraipa, Gary McManus, Philip O'Brien, Ricardo Jardim-Gonçalves. Survey on assistive technologies for people with Dementia
53 -- 59Nikos Papageorgiou, Yiannis Verginadis, Dimitris Apostolou, Gregoris Mentzas. Fog computing context analytics
60 -- 61Richard S. Davis. Basic metrology: Scattering of light by light
62 -- 67Francesco Bonavolontà, Mauro D'Arco, Annalisa Liccardo, Oscar Tamburis. Remote laboratory design and implementation as a measurement and automation experiential learning opportunity
68 -- 75Malik Khalfallah, Parisa Ghodous. Satellite overall test matrix
76 -- 77Vincenzo Marietta. Life after graduation: IoT: Forecasts, challenges and opportunities
78 -- 81Bruno Andò, Baki Karaböce. Society news: IEEE measurement and networking symposium, 2019 (M&N 2019)
83 -- 87Robert Goldberg. New products