External Links

    Journal: IEEE Instrum. Meas. Mag.

    Volume 23, Issue 3

    2 -- 0Bruno Andò. Editorial: Instrumentation and measurement in 2020
    3 -- 9Katelyn Brinker, Reza Zoughi. Future trends for I&M
    10 -- 20Richard Davis, Stephan Schlamminger. Basic metrology for 2020
    21 -- 26Boon-Yaik Ooi, Shervin Shirmohammadi. The potential of IoT for instrumentation and measurement
    27 -- 31Veronica Scotti. Artificial intelligence
    32 -- 34Dario Petri. Big data, dataism and measurement
    35 -- 41Davorin Ambrus, Darko Vasic, Vedran Bilas. Innovating on top of I&M fundamentals for safer humanitarian demining
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