Journal: J. Intelligent Manufacturing

Volume 2, Issue 3

137 -- 153Lee Becker, Todd Guay. Knowledge reusability in diagnostic environments
155 -- 163Deborah F. Cook, Robert E. Shannon. A sensitivity analysis of a back-propagation neural network for manufacturing process parameters
165 -- 175Behrokh Khoshnevis, Qing Mei Chen. Integration of process planning and scheduling functions
177 -- 187Jose M. Sanchez, John W. Priest. Optimal component-insertion sequenceplanning methodology for the semiautomatic assembly of printed circuit boards
189 -- 196Lisa J. Burnell, John W. Priest, Karan Briggs. An intelligent decision theoretic approach to producibility optimization in conceptual design