Journal: J. Intelligent Manufacturing

Volume 33, Issue 4

911 -- 927Constantin Waubert de Puiseau, Richard Meyes, Tobias Meisen. On reliability of reinforcement learning based production scheduling systems: a comparative survey
929 -- 942Jingran Liang, Zhengning Wu, Chenye Zhu, Zhi-Hai Zhang. An estimation distribution algorithm for wave-picking warehouse management
943 -- 952Zengya Zhao, Sibao Wang, Zehua Wang, Shilong Wang, Chi Ma, Bo Yang 0042. Surface roughness stabilization method based on digital twin-driven machining parameters self-adaption adjustment: a case study in five-axis machining
953 -- 972Junqi Liu, Zeqiang Zhang, Feng Chen, Silu Liu, Lixia Zhu. A novel hybrid immune clonal selection algorithm for the constrained corridor allocation problem
973 -- 983Huanjie Wang, Xiwei Bai, Jie Tan, Jiechao Yang. Deep prototypical networks based domain adaptation for fault diagnosis
985 -- 994Asli Çelik, Ayhan Küçükmanisa, Aydin Sümer, Aysun Tasyapi Çelebi, Oguzhan Urhan. A real-time defective pixel detection system for LCDs using deep learning based object detectors
995 -- 1005Heqi Xu, Qingyang Liu, Jazzmin Casillas, Mei Mcanally, Noshin Mubtasim, Lauren S. Gollahon, Dazhong Wu, Changxue Xu. Prediction of cell viability in dynamic optical projection stereolithography-based bioprinting using machine learning
1007 -- 1020Saksham Jain, Gautam Seth, Arpit Paruthi, Umang Soni, Girish Kumar. Synthetic data augmentation for surface defect detection and classification using deep learning
1021 -- 1030Robson Flavio Castro, Moacir Godinho Filho, Roberto Fernandes Tavares Neto. Dispatching method based on particle swarm optimization for make-to-availability
1031 -- 1055Rubén Medina, Jean-Carlo Macancela, Pablo Lucero, Diego Cabrera, René-Vinicio Sánchez, Mariela Cerrada. Gear and bearing fault classification under different load and speed by using Poincaré plot features and SVM
1057 -- 1072Yi Zhang, Peng Peng, Chongdang Liu, Yanyan Xu, Heming Zhang. A sequential resampling approach for imbalanced batch process fault detection in semiconductor manufacturing
1073 -- 1086Jingchao Jiang, Yi Xiong, Zhiyuan Zhang, David W. Rosen. Machine learning integrated design for additive manufacturing
1087 -- 1098Matthias Kaltenbrunner, Maria Anna Huka, Manfred Gronalt. Heuristic based approach for short term production planning in highly automated customer oriented pallet production
1099 -- 1123Tobias Schlosser, Michael Friedrich 0005, Frederik Beuth, Danny Kowerko. Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks
1125 -- 1138Patrick G. Mongan, Vedant Modi, John Mclaughlin, Eoin P. Hinchy, Ronan M. O'Higgins, Noel P. O'Dowd, Conor T. McCarthy. Multi-objective optimisation of ultrasonically welded dissimilar joints through machine learning
1139 -- 1163Baifan Zhou, Tim Pychynski, Markus Reischl, Evgeny Kharlamov, Ralf Mikut. Machine learning with domain knowledge for predictive quality monitoring in resistance spot welding
1165 -- 1180Haochen Mu, Joseph Polden, Yuxing Li, Fengyang He, Chunyang Xia, Zengxi Pan. Layer-by-layer model-based adaptive control for wire arc additive manufacturing of thin-wall structures
1181 -- 1188XiuLi Wu, Junjian Peng, Xiao Xiao, Shaomin Wu. Correction to: An effective approach for the dual-resource flexible job shop scheduling problem considering loading and unloading