Journal: IEEE Micro

Volume 21, Issue 5

5 -- 0Ken Sakamura. Surviving the Slump, Building the Future
6 -- 0Shane M. Greenstein. Explaining Booms, Busts, and Errors
8 -- 10Richard H. Stern. Another Update on Standardization Skullduggery
12 -- 15Dimiter R. Avresky, Fabrizio Lombardi, Karl-Erwin Großpietsch, Barry W. Johnson. Guest Editors Introduction: Fault-Tolerant Embedded Systems
16 -- 22Alfredo Benso, Silvia Chiusano, Paolo Prinetto. A Self-Repairing Execution Unit for Microprogrammed Processors
24 -- 40Matthias Pflanz, Heinrich Theodor Vierhaus. Online Check and Recovery Techniques for Dependable Embedded Processors
41 -- 51Paul Richardson, Larry Sieh, Ali M. Elkateeb. Fault-Tolerant Adaptive Scheduling for Embedded Real-Time Systems
52 -- 62Andrea Bondavalli, Alessandro Fantechi, Diego Latella, Luca Simoncini. Design Validation of Embedded Dependable Systems
64 -- 76Gregory M. Provan, Yi-Liang Chen. Model-Based Fault-tolerant Control Reconfiguration for General Network Topologies
77 -- 85Wenyi Feng, Farzin Karimi, Fabrizio Lombardi. Fault Detection in a Tristate System Environment
86 -- 87Richard Mateosian. Managing Development