Journal: Networks

Volume 25, Issue 4

177 -- 182M. Florian, S. J. Thomas, R. V. M. Zahar. On truncated-newton methods for solving the spatial price equilibrium problem
183 -- 191Gopalakrishnan Sundaram, Steven Skiena. Recognizing small subgraphs
193 -- 197Guoli Ding. Graphs with not too many spanning trees
199 -- 216Egon Balas. The prize collecting traveling salesman problem: II. Polyhedral results

Volume 25, Issue 3

99 -- 0Charles J. Colbourn, Klaus Sutner. Preface
101 -- 115Michael O. Ball, Jane N. Hagstrom, J. Scott Provan. Threshold reliability of networks with small failure sets
117 -- 130Adam L. Buchsbaum, Milena Mihail. Monte Carlo and Markov Chain techniques for network reliability and sampling
131 -- 138Jsen-Shung Lin, Chin-Chia Jane, John Yuan. On reliability evaluation of a capacitated-flow network in terms of minimal pathsets
139 -- 146Gerard T. Lingner, Themistocles Politof, A. Satyanarayana. A forbidden minor characterization and reliability of a class of partial 4-trees
147 -- 163Suresh Rai, Malathi Veeraraghavan, Kishor S. Trivedi. A survey of efficient reliability computation using disjoint products approach
165 -- 175Heidi J. Strayer, Charles J. Colbourn. k-terminal reliability

Volume 25, Issue 2

41 -- 43Jason Fulman, Denis Hanson, Gary MacGillivray. Vertex domination-critical graphs
45 -- 58Igor Averbakh, Oded Berman. Sales-delivery man problems on treelike networks
59 -- 68Madhav V. Marathe, H. Breu, Harry B. Hunt III, S. S. Ravi, Daniel J. Rosenkrantz. Simple heuristics for unit disk graphs
69 -- 87Jeffrey S. Salowe, David M. Warme. Thirty-five-point rectilinear steiner minimal trees in a day
89 -- 98Ravindra K. Ahuja, James B. Orlin. A capacity scaling algorithm for the constrained maximum flow problem

Volume 25, Issue 1

1 -- 5Jerzy Topp. Sequences of graphical invariants
7 -- 17Barry L. Piazza, Fred S. Robertst, Sam Stueckle. Edge-tenacious networks
19 -- 30E. S. Elmallah, J. C. Culberson. Multicommodity flows in simple multistage networks
31 -- 39Marion Rodrigues, Hasan Ural. Lower bounds for the length of test sequences using UIOs