Journal: IEEE Trans. Pattern Anal. Mach. Intell.

Volume 31, Issue 2

193 -- 209Tal Steinherz, David S. Doermann, Ehud Rivlin, Nathan Intrator. Offline Loop Investigation for Handwriting Analysis
210 -- 227John Wright, Allen Y. Yang, Arvind Ganesh, S. Shankar Sastry, Yi Ma. Robust Face Recognition via Sparse Representation
228 -- 244Manuela Vasconcelos, Nuno Vasconcelos. Natural Image Statistics and Low-Complexity Feature Selection
245 -- 259Gonzalo Martínez-Muñoz, Daniel Hernández-Lobato, Alberto Suárez. An Analysis of Ensemble Pruning Techniques Based on Ordered Aggregation
260 -- 274Dacheng Tao, Xuelong Li, Xindong Wu, Stephen J. Maybank. Geometric Mean for Subspace Selection
275 -- 287Shihao Ji, L. T. Watson, Lawrence Carin. Semisupervised Learning of Hidden Markov Models via a Homotopy Method
288 -- 305Yixin Chen, Xin Dang, Hanxiang Peng, Henry L. Bart. Outlier Detection with the Kernelized Spatial Depth Function
306 -- 318Pierre-Francois Marteau. Time Warp Edit Distance with Stiffness Adjustment for Time Series Matching
319 -- 336Rangachar Kasturi, Dmitry B. Goldgof, Padmanabhan Soundararajan, Vasant Manohar, John S. Garofolo, Rachel Bowers, Matthew Boonstra, Valentina N. Korzhova, Jing Zhang. Framework for Performance Evaluation of Face, Text, and Vehicle Detection and Tracking in Video: Data, Metrics, and Protocol
337 -- 350A. M. Peter, A. Rangarajan. Information Geometry for Landmark Shape Analysis: Unifying Shape Representation and Deformation
351 -- 363J. Ross Beveridge, Bruce A. Draper, Jen-Mei Chang, Michael Kirby, Holger Kley, Chris Peterson. Principal Angles Separate Subject Illumination Spaces in YDB and CMU-PIE
357 -- 363Natasa Sladoje, Joakim Lindblad. High-Precision Boundary Length Estimation by Utilizing Gray-Level Information
364 -- 369Daniel Hernández-Lobato, Gonzalo Martínez-Muñoz, Alberto Suárez. Statistical Instance-Based Pruning in Ensembles of Independent Classifiers
370 -- 375Graziano Chesi. Camera Displacement via Constrained Minimization of the Algebraic Error
376 -- 383Damien Douxchamps, Kunihiro Chihara. High-Accuracy and Robust Localization of Large Control Markers for Geometric Camera Calibration