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    Journal: Pattern Recognition

    Volume 4, Issue 4

    341 -- 0Robert S. Ledley. About this issue
    343 -- 344Yoshiaki Shirai, Saburo Tsuji. Extraction of the line drawing of 3-dimensional objects by sequential illumination from several directions
    353 -- 359Sheldon S. Sandler. Direct three-dimensional analysis of electron micrograph pictures
    361 -- 366Oscar Firschein, Martin A. Fischler. A study in descriptive representation of pictorial data
    379 -- 389D. W. Thomas, B. R. Wilkins. The analysis of vehicle sounds for recognition
    391 -- 400Lucio Pietrantonio, Peter C. Jurs. Iterative least squares development of discriminant functions for spectroscopic data analysis by pattern recognition
    401 -- 416Periagaram K. Rajasekaran, Mandyam D. Srinath. Unsupervised learning in nongaussian pattern recognition

    Volume 4, Issue 3

    233 -- 0Robert S. Ledley. About this issue
    243 -- 244Yoshiaki Shirai. Recognition of polyhedrons with a range finder
    251 -- 262Kokichi Tanaka, Kazumasa Ozawa. A new type of feature extraction of patterns using coherent optical system
    263 -- 273David M. Jackson, Lee J. White. Effect of random errors on generalized distance computations
    275 -- 288R. M. Bowman, Eugene S. McVey. Calculation of multi-category minimum distance classifier recognition error for binomial measurement distributions
    289 -- 305Tsuguchika Kaminuma, Satosi Watanabe. Fast-converging adaptive algorithms for well-balanced separating linear classifier
    307 -- 315Israel Gitman. A parameter-free clustering model
    331 -- 332William J. Sacco, Wayne S. Copes. Reduction of the class of feature evaluation techniques in pattern analysis

    Volume 4, Issue 2

    145 -- 0Robert S. Ledley. Introduction to the special issue on fine particle science
    147 -- 150Brian H. Kaye. Efficient pattern recognition in fine particle science
    155 -- 158A. I. Medalia, G. J. Hornik. Pattern recognition problems in the study of carbon black
    173 -- 192E. W. White, Kathy Mayberry, G. G. Johnson Jr.. Computer analysis of multi-channel SEM and X-ray images from fine particles
    195 -- 196Brian H. Kaye, A. G. Naylor. An optical information procedure for characterizing the shape of fine particle images
    201 -- 210C. B. Shelman. The application of list processing techniques to picture processing
    211 -- 226Edward A. Patrick, Joseph Altman, Richard Wild. Computer output display of cells and cell features

    Volume 4, Issue 1

    1 -- 0Robert S. Ledley. Editorial comment
    3 -- 0K. S. Fu. Introduction to special issue on syntactic pattern recognition--part two
    5 -- 17Theodosios Pavlidis. Representation of figures by labeled graphs
    19 -- 36Kenneth J. Breeding, John O. Amoss. A pattern description language - PADEL
    37 -- 51John Mylopoulos. On the application of formal language and automata theory to pattern recognition
    53 -- 72Luigia Carlucci. A formal system for texture languages
    73 -- 81J. C. Simon, A. Checroun, C. Roche. A method of comparing two patterns independent of possible transformations and small distortions
    83 -- 100Philip H. Swain, K. S. Fu. Stochastic programmed grammars for syntactic pattern recognition
    101 -- 140I. B. Muchnik. Simulation of process of forming the language for description and analysis of the forms of images
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