Journal: Statistics and Computing

Volume 10, Issue 2

91 -- 93Mark Berman. Guest editorial: Image analysis
95 -- 103Fionn Murtagh, Jean-Luc Starck. Image processing through multiscale analysis and measurement noise modeling
105 -- 120Edmond J. Breen, Ronald Jones, Hugues Talbot. Mathematical morphology: A useful set of tools for image analysis
121 -- 132Dominique Jeulin. Random texture models for material structures
133 -- 145Shyam Kuttikkad, Rama Chellappa. Statistical modeling and analysis of high-resolution Synthetic Aperture Radar images
147 -- 165Richard M. Leahy, Jinyi Qi. Statistical approaches in quantitative positron emission tomography
167 -- 182Anil K. Jain, Chitra Dorai. 3D object recognition: Representation and matching