Journal: Scientometrics

Volume 82, Issue 1

1 -- 2Tibor Braun. Editorial
3 -- 0Tibor Braun, András Schubert, Wolfgang Glänzel. Editorial
5 -- 19Pao-Long Chang, Chao-Chan Wu, Hoang-Jyh Leu. Using patent analyses to monitor the technological trends in an emerging field of technology: a case of carbon nanotube field emission display
21 -- 36Chen-Yuan Liu, Jhen-Cheng Wang. Forecasting the development of the biped robot walking technique in Japan through S-curve model analysis
37 -- 58Yi-Chia Chiu, Hsien-Che Lai, Yi-Ching Liaw, Tai-Yu Lee. Technological scope: diversified or specialized
59 -- 74Alka Chadha, Raffaele Oriani. R&D market value under weak intellectual property rights protection: the case of India
75 -- 82Yu-Shan Chen, Ke-Chiun Chang. Analyzing the nonlinear effects of firm size, profitability, and employee productivity on patent citations of the US pharmaceutical companies by using artificial neural network
83 -- 92Yong-Gil Lee. Sectoral strategic differences of technological development between electronics and chemistry: a historical view from analyses of Korean-invented US patents during the period of 1989-1992
93 -- 108Antje Klitkou, Magnus Gulbrandsen. The relationship between academic patenting and scientific publishing in Norway
109 -- 120Szu-chia S. Lo. Scientific linkage of science research and technology development: a case of genetic engineering research
121 -- 134Shiu-Wan Hung, An-Pang Wang. Examining the small world phenomenon in the patent citation network: a case study of the radio frequency identification (RFID) network
135 -- 148Yong-Gil Lee, Ji Hoon Lee. Different characteristics between auctioned and non-auctioned patents
149 -- 163Dar-Zen Chen, Chang-Pin Lin, Mu-Hsuan Huang, Chen-Yu Huang. Constructing a new patent bibliometric performance measure by using modified citation rate analyses with dynamic backward citation windows
165 -- 173Jiancheng Guan, Kaihua Chen. Modeling macro-R&D production frontier performance: an application to Chinese province-level R&D
175 -- 183Yin-Hui Cheng, Fu-Yung Kuan, Shih-Chieh Chuang, Yun Ken. Profitability decided by patent quality? An empirical study of the U.S. semiconductor industry
185 -- 200Rainer Frietsch, Ulrich Schmoch. Transnational patents and international markets
201 -- 210Yu-Shan Chen, Ke-Chiun Chang. The nonlinear nature of the relationships between the patent traits and corporate performance