Journal: ACM StandardView

Volume 5, Issue 3

93 -- 0Carl Cargill. Prologue and introduction
97 -- 98Lawrence Wills, John Godfrey. An introduction to "standards, conformity, assessment, and trade"
103 -- 109Lisa Carnahan, Gary Carver, Martha Gray, Michael Hogan, Theodore Hopp, Jeffrey Horlick, Gordon Lyon, Elena Messina. Metrology for information technology
110 -- 114Lynne Rosenthal, Mark Skall, Mary Brady, Carmelo Montanez-Rivera. Web-based conformance testing for VRML
115 -- 117David S. Pallett, Janet M. Baker. Tests, measurements, and automatic speech recognition
118 -- 124Dennis D. Steinauer, Shukri A. Wakid, Stanley Rasberry. Trust and traceability in electronic commerce