Journal: Softw. Test., Verif. Reliab.

Volume 25, Issue 4

333 -- 0Benoit Baudry, Alessandro Orso. Special issue for the ICST 2013 conference
334 -- 370Shin Hong, Matt Staats, Jaemin Ahn, Moonzoo Kim, Gregg Rothermel. Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation
371 -- 396Daniel Di Nardo, Nadia Alshahwan, Lionel C. Briand, Yvan Labiche. Coverage-based regression test case selection, minimization and prioritization: a case study on an industrial system
397 -- 425Yu Lin, Danny Dig. A study and toolkit of CHECK-THEN-ACT idioms of Java concurrent collections
426 -- 459Gerardo Canfora, Andrea De Lucia, Massimiliano Di Penta, Rocco Oliveto, Annibale Panichella, Sebastiano Panichella. Defect prediction as a multiobjective optimization problem