Journal: Softw. Test., Verif. Reliab.

Volume 32, Issue 7

0 -- 0Manar H. Alalfi, Sajeda Parveen, Bara' Nazzal. A mutation framework for evaluating security analysis tools in IoT applications
0 -- 0Khaled El-Fakih, Ayman Alzaatreh, Uraz Cengiz Türker. Assessing test suites of extended finite state machines against model- and code-based faults
0 -- 0Rahul Gopinath, Jie M. Zhang, Marinos Kintis, Mike Papadakis. Mutation analysis and its industrial applications
0 -- 0Yunho Kim, Shin Hong. Learning-based mutant reduction using fine-grained mutation operators