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Journal: Softw. Test., Verif. Reliab.
Home
Index
Info
Issue
Volume
32
, Issue
7
0
--
0
Manar H. Alalfi
,
Sajeda Parveen
,
Bara' Nazzal
.
A mutation framework for evaluating security analysis tools in IoT applications
0
--
0
Khaled El-Fakih
,
Ayman Alzaatreh
,
Uraz Cengiz Türker
.
Assessing test suites of extended finite state machines against model- and code-based faults
0
--
0
Rahul Gopinath
,
Jie M. Zhang
,
Marinos Kintis
,
Mike Papadakis
.
Mutation analysis and its industrial applications
0
--
0
Yunho Kim
,
Shin Hong
.
Learning-based mutant reduction using fine-grained mutation operators