Journal: Technometrics

Volume 45, Issue 4

281 -- 282William I. Notz. Editor's Report
283 -- 0William I. Notz. Editorial Announcement
284 -- 292V. Roshan Joseph. Robust Parameter Design With Feed-Forward Control
293 -- 311Irad Ben-Gal, Gail Morag, Armin Shmilovici. Context-Based Statistical Process Control - A Monitoring Procedure for State-Dependent Processes
312 -- 325Shiyu Zhou, Yu Ding, Yong Chen, Jianjun Shi. Diagnosability Study of Multistage Manufacturing Processes Based on Linear Mixed-Effects Models
326 -- 332Glen Hartless, James G. Booth, Ramon C. Littell. Local Influence of Predictors in Multiple Linear Regression
333 -- 339Steven G. Gilmour, Norman R. Draper. Confidence Regions Around the Ridge of Optimal Response on Fitted Second-Order Response Surfaces
340 -- 346Erwin Stinstra, Dick den Hertog, Peter Stehouwer, Arjen P. A. Vestjens. Constrained Maximin Designs for Computer Experiments
347 -- 351William Li, Dennis K. J. Lin, Kenny Q. Ye. Optimal Foldover Plans for Two-Level Nonregular Orthogonal Designs
352 -- 360Weiming Ke, Boxin Tang. m-p Designs Using a Minimum Aberration Criterion When Some Two-Factor Interactions Are Important
362 -- 0Margaret A. Nemeth. Multi- and Megavariate Data Analysis
362 -- 363David J. Olive. Linear Regression Analysis
363 -- 0Diane K. Michelson. Components of Variance
363 -- 364Edward C. Chao. Generalized Estimating Equations
364 -- 365Nicole A. Lazar. Statistical Analysis With Missing Data
364 -- 0Bonnie K. Ray. Regression Models for Time Series Analysis
365 -- 0Eric R. Ziegel. Experimental Design for Combinatorial and High Throughput Materials Development
366 -- 367Christopher K. Wikle. Modeling Hydrologic Change: Statistical Methods
366 -- 0Paul A. Tobias. Process Improvement in the Electronics Industry
367 -- 368Charles Annis. Mechanical Reliability Improvement - Probability and Statistics for Experimental Testing
368 -- 0J. Wade Davis. Statistical Pattern Recognition
369 -- 370J. Charles Kerkering. Subjective and Objective Bayesian Statistics: Principles, Models, and Applications
369 -- 0Ronald H. Randles. Applied Nonparametric Statistical Methods
369 -- 0Robert H. Kushler. Statistical Computing: An Introduction to Data Analysis Using S-PLUS
370 -- 371Mark A. McComb. Comparison Methods for Stochastic Models and Risks
371 -- 0W. Michael Conklin, Stan Lipovetsky. Chaos: A Statistical Perspective