Journal: Technometrics

Volume 52, Issue 3

265 -- 277Peihua Qiu, Changliang Zou, Zhaojun Wang. Nonparametric Profile Monitoring by Mixed Effects Modeling
277 -- 280Daniel W. Apley. Comment
280 -- 283Hugh A. Chipman, R. Jock MacKay, Stefan H. Steiner. Comment
283 -- 285Fugee Tsung. Comment
285 -- 287William H. Woodall, Jeffrey B. Birch, Pang Du. Comment
288 -- 293Peihua Qiu, Changliang Zou, Zhaojun Wang. Rejoinder
294 -- 302Ryan P. Browne, R. Jock MacKay, Stefan H. Steiner. Leveraged Gauge R&R Studies
303 -- 312David Hoffman. One-Sided Tolerance Limits for Balanced and Unbalanced Random Effects Models
313 -- 323Takeshi Emura, Hsiuying Wang. Approximate Tolerance Limits Under Log-Location-Scale Regression Models in the Presence of Censoring
324 -- 334Javier Cano-Montero, Javier M. Moguerza, David RĂ­os Insua. Bayesian Reliability, Availability, and Maintainability Analysis for Hardware Systems Described Through Continuous Time Markov Chains
335 -- 339Jin Zhang. Improving on Estimation for the Generalized Pareto Distribution
340 -- 348Huiping Xu, Bruce A. Craig. Likelihood Analysis of Multivariate Probit Models Using a Parameter Expanded MCEM Algorithm
349 -- 361Shifeng Xiong. Some Notes on the Nonnegative Garrote