Journal: Technometrics

Volume 52, Issue 4

376 -- 378David M. Steinberg. Editor's Report
379 -- 389J. Brian Hall, Paul M. Ellner, Ali Mosleh 0001. Reliability Growth Management Metrics and Statistical Methods for Discrete-Use Systems
389 -- 391Donald P. Gaver, Patricia A. Jacobs. Comment
391 -- 392Patrick D. T. O'Connor. Comment
393 -- 395Ananda Sen, Arthur Fries. Comment
396 -- 397Nozer D. Singpurwalla. Comment
397 -- 400Alyson G. Wilson, Christine M. Anderson-Cook. Comment
401 -- 408J. Brian Hall, Paul M. Ellner, Ali Mosleh 0001. Rejoinder
409 -- 420Xianggui Qu. Optimal Row-Column Designs in High-Throughput Screening Experiments
421 -- 429Holger Dette, Andrey Pepelyshev. Generalized Latin Hypercube Design for Computer Experiments
430 -- 437Dorin Drignei. Functional ANOVA in Computer Models With Time Series Output
438 -- 452Panagiotis Tsiamyrtzis, Douglas M. Hawkins. Bayesian Startup Phase Mean Monitoring of an Autocorrelated Process That Is Subject to Random Sized Jumps
453 -- 460Bing Xing Wang, Keming Yu, M. C. Jones. Inference Under Progressively Type II Right-Censored Sampling for Certain Lifetime Distributions