Journal: Technometrics

Volume 53, Issue 1

1 -- 15Enrique del Castillo, Bianca Maria Colosimo. Statistical Shape Analysis of Experiments for Manufacturing Processes
16 -- 28Mark Fielding, David J. Nott, Shie-Yui Liong. Efficient MCMC Schemes for Computationally Expensive Posterior Distributions
29 -- 43Peter C. Young, Marco Ratto. Statistical Emulation of Large Linear Dynamic Models
44 -- 53Ricardo A. Maronna. Robust Ridge Regression for High-Dimensional Data
54 -- 61Ryan J. Tibshirani, Holger Höfling, Robert Tibshirani. Nearly-Isotonic Regression
62 -- 71Bradley A. Jones, Christopher J. Nachtsheim. Efficient Designs With Minimal Aliasing
72 -- 83K. Krishnamoorthy, Avishek Mallick, Thomas Mathew. Inference for the Lognormal Mean and Quantiles Based on Samples With Left and Right Type I Censoring
84 -- 97Changliang Zou, Fugee Tsung. A Multivariate Sign EWMA Control Chart