Journal: Technometrics

Volume 57, Issue 4

445 -- 0Peihua Qiu. Editorial Announcement
446 -- 448Peihua Qiu. Editor's Report
449 -- 456L. Brown, A. N. Donev, A. C. Bissett. General Blending Models for Data From Mixture Experiments
457 -- 467Matthias Hwai Yong Tan. Stochastic Polynomial Interpolation for Uncertainty Quantification With Computer Experiments
468 -- 478Matthias Hwai Yong Tan. Robust Parameter Design With Computer Experiments Using Orthonormal Polynomials
479 -- 487Shan Ba, William R. Myers, William A. Brenneman. Optimal Sliced Latin Hypercube Designs
488 -- 502Bagus Sartono, Peter Goos, Eric Schoen. Constructing General Orthogonal Fractional Factorial Split-Plot Designs
503 -- 513Daniel V. Samarov, Jeeseong Hwang, Maritoni Litorja. The Spatial LASSO With Applications to Unmixing Hyperspectral Biomedical Images
514 -- 523Kamran Paynabar, Judy Jin, Matthew P. Reed. Informative Sensor and Feature Selection via Hierarchical Nonnegative Garrote
524 -- 534Wenxuan Zhong, Kenneth S. Suslick. Matrix Discriminant Analysis With Application to Colorimetric Sensor Array Data
535 -- 546Yimin Kao, Brian J. Reich, Curtis B. Storlie, Blake Anderson. Malware Detection Using Nonparametric Bayesian Clustering and Classification Techniques
547 -- 558Andrew L. Rukhin. Confidence Regions and Intervals for Meta-Analysis Model Parameters
559 -- 565Fang Wan, Wei Liu 0030, Yang Han, Frank Bretz. An Exact Confidence Set for a Maximum Point of a Univariate Polynomial Function in a Given Interval
566 -- 575Yongho Jeon, Jeongyoun Ahn, Cheolwoo Park. A Nonparametric Kernel Approach to Interval-Valued Data Analysis
576 -- 585Vignesh T. Subrahmaniam, Anup Dewanji, Bimal K. Roy. A Semiparametric Software Reliability Model for Analysis of a Bug-Database With Multiple Defect Types