Journal: Technometrics

Volume 59, Issue 2

139 -- 152Ray-Bing Chen, Weichung Wang, C. F. Jeff Wu. Sequential Designs Based on Bayesian Uncertainty Quantification in Sparse Representation Surrogate Modeling
153 -- 164Avishek Chakraborty, Derek Bingham, Soma S. Dhavala, Carolyn C. Kuranz, R. Paul Drake, Michael J. Grosskopf, Erica M. Rutter, Ben R. Torralva, James Paul Holloway, Ryan G. McClarren, Bani K. Mallick. Emulation of Numerical Models With Over-Specified Basis Functions
165 -- 177Matthew Plumlee, Daniel W. Apley. Lifted Brownian Kriging Models
178 -- 188Grant Schneider, Peter F. Craigmile, Radu Herbei. Maximum Likelihood Estimation for Stochastic Differential Equations Using Sequential Gaussian-Process-Based Optimization
189 -- 201Tonglin Zhang, Baijian Yang. Box-Cox Transformation in Big Data
202 -- 214Wei Zhang, Ye Tian, Luis A. Escobar, William Q. Meeker. Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes
215 -- 224Xiang Zhang, Alyson Wilson. System Reliability and Component Importance Under Dependence: A Copula Approach
225 -- 236Zhibing Xu, Yili Hong, William Q. Meeker, Brock E. Osborn, Kati Illouz. A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data
237 -- 246Mimi Zhang, Min Xie 0001. An Ameliorated Improvement Factor Model for Imperfect Maintenance and Its Goodness of Fit
247 -- 261Ye Tian, Ranjan Maitra, William Q. Meeker, Stephen D. Holland. A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images
262 -- 270Konstantinos Fokianos, M. Pitsillou. Consistent Testing for Pairwise Dependence in Time Series