Journal: Technometrics

Volume 50, Issue 4

415 -- 417David M. Steinberg. Editor's Report
418 -- 435Leland Wilkinson. The Future of Statistical Computing
435 -- 437John M. Chambers. Comment
437 -- 439R. Wayne Oldford. Comment
439 -- 440Douglas Bates. Comment
440 -- 441Pat Hanrahan. Comment
442 -- 443Dianne Cook, Hadley Wickham. Comment
443 -- 446Duncan Temple Lang, Ross Ihaka. Comment
446 -- 447Leland Wilkinson. Rejoinder
448 -- 461Natallia Katenka, Elizaveta Levina, George Michailidis. Robust Target Localization From Binary Decisions in Wireless Sensor Networks
462 -- 467Paul H. Kvam. Length Bias in the Measurements of Carbon Nanotubes
468 -- 478Wessel N. van Wieringen, Jeroen de Mast. Measurement System Analysis for Binary Data
479 -- 486Johannes Forkman. A Method for Designing Nonlinear Univariate Calibration
487 -- 500Graciela Boente, Andrés Farall. Robust Multivariate Tolerance Regions: Influence Function and Monte Carlo Study
501 -- 511Olivia A. Grigg, David J. Spiegelhalter. An Empirical Approximation to the Null Unbounded Steady-State Distribution of the Cumulative Sum Statistic
512 -- 526Changliang Zou, Fugee Tsung, Zhaojun Wang. Monitoring Profiles Based on Nonparametric Regression Methods
527 -- 541Pritam Ranjan, Derek Bingham, George Michailidis. Sequential Experiment Design for Contour Estimation From Complex Computer Codes

Volume 50, Issue 3

241 -- 264Julia Brettschneider, François Collin, Benjamin M. Bolstad, Terence P. Speed. Quality Assessment for Short Oligonucleotide Microarray Data
265 -- 267Wendell Jones. Comment
268 -- 271Lei Bao, Ina Hoeschele. Comment
271 -- 274Wenqing He, Shelley B. Bull. Comment
274 -- 276Jude Kendall, B. Lakshmi. Comment
276 -- 279Darlene R. Goldstein. Comment
279 -- 283Julia Brettschneider, François Collin, Benjamin M. Bolstad, Terence P. Speed. Rejoinder
284 -- 294Irene Epifanio. Shape Descriptors for Classification of Functional Data
295 -- 304Ricardo A. Maronna, Victor J. Yohai. Robust Low-Rank Approximation of Data Matrices With Elementwise Contamination
305 -- 316Yi Fang 0003, Myong K. Jeong. Robust Probabilistic Multivariate Calibration Model
317 -- 331Konstantinos Fokianos, Alexios Savvides. On Comparing Several Spectral Densities
332 -- 343Xuemei Shan, Daniel W. Apley. Blind Identification of Manufacturing Variation Patterns by Combining Source Separation Criteria
344 -- 356Changliang Zou, Fugee Tsung, Yukun Liu. A Change Point Approach for Phase I Analysis in Multistage Processes
357 -- 370Giovanna Capizzi, Guido Masarotto. Practical Design of Generalized Likelihood Ratio Control Charts for Autocorrelated Data
371 -- 382Robert W. Mee, Jihua (Regina) Xiao. Steepest Ascent for Multiple-Response Applications
383 -- 396Peter Z. G. Qian, Huaiqing Wu, C. F. Jeff Wu. Gaussian Process Models for Computer Experiments With Qualitative and Quantitative Factors
397 -- 406Siddhartha R. Dalal, Colin L. Mallows. Optimal Stopping With Exact Confidence on Remaining Defects
407 -- 408Madhuri S. Mulekar. Weight-of Evidence for Forensic DNA Profiles
408 -- 0Mark A. McComb. The Quality Toolbox
408 -- 409Peihua Qiu. Fuzzy Modeling and Fuzzy Control
409 -- 0Jeffrey E. Jarrett. The Nature of Statistical Evidence
409 -- 410Willis A. Jensen. Decision Trees for Business Intelligence and Data Mining: Using SAS® Enterprise Miner™
409 -- 0Harriet Black Nembhard. Statistical Methods for Dose-Finding Experiments
410 -- 411Charles E. Heckler. Introduction to Mixed Modelling. Beyond Regression and Analysis of Variance
411 -- 0Chris Andrews. Competing Risks: A Practical Perspective
411 -- 412Snigdhansu Chatterjee. Structural Equation Modeling, A Bayesian Approach

Volume 50, Issue 2

103 -- 127David M. Steinberg, Søren Bisgaard, Necip Doganaksoy, Nicholas Fisher, Bert Gunter, Gerald J. Hahn, Sallie Keller-McNulty, Jon R. Kettenring, William Q. Meeker, Douglas C. Montgomery, C. F. Jeff Wu. The Future of Industrial Statistics: A Panel Discussion
128 -- 143Jianying Zuo, William Q. Meeker, Huaiqing Wu. Analysis of Window-Observation Recurrence Data
144 -- 154Debasis Kundu. Bayesian Inference and Life Testing Plan for the Weibull Distribution in Presence of Progressive Censoring
155 -- 166Douglas M. Hawkins, Edgard M. Maboudou-Tchao. Multivariate Exponentially Weighted Moving Covariance Matrix
167 -- 181Tirthankar Dasgupta, Abhyuday Mandal. Estimation of Process Parameters to Determine the Optimum Diagnosis Interval for Control of Defective Items
182 -- 191Earl Lawrence, Derek Bingham, Chuanhai Liu, Vijayan N. Nair. Bayesian Inference for Multivariate Ordinal Data Using Parameter Expansion
192 -- 204Peter Z. G. Qian, C. F. Jeff Wu. Bayesian Hierarchical Modeling for Integrating Low-Accuracy and High-Accuracy Experiments
205 -- 215Max D. Morris, Leslie M. Moore, Michael D. McKay. Using Orthogonal Arrays in the Sensitivity Analysis of Computer Models
216 -- 227Jian Zhang, Peter F. Craigmile, Noel Cressie. Loss Function Approaches to Predict a Spatial Quantile and Its Exceedance Region
228 -- 229Georges H. Guirguis. A Note on Computing the Probability and Critical Values for the Half-Normal Plot
231 -- 0Thomas P. Ryan. Modern Experimental Design

Volume 50, Issue 1

1 -- 0David M. Steinberg. Technometrics at Fifty
2 -- 7David M. Steinberg, Søren Bisgaard. Technometrics - How It All Started
8 -- 14Nicolas W. Hengartner, Sarah Ellen Michalak, Bruce E. Takala, Stephen A. Wender. Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam
15 -- 25Anna-Jane E. Vine, Susan M. Lewis, Angela M. Dean, David Brunson. A Critical Assessment of Two-Stage Group Screening Through Industrial Experimentation
26 -- 31Nam-Ky Nguyen, Ching-Shui Cheng. 2)-Optimal Supersaturated Designs Constructed From Incomplete Block Designs
32 -- 39Maria Tripolski Kimel, Yoav Benjamini, David M. Steinberg. The False Discovery Rate for Multiple Testing in Factorial Experiments
40 -- 52Hyun-young Choi, Hernando Ombao, Bonnie Ray. Sequential Change-Point Detection Methods for Nonstationary Time Series
53 -- 63Daniel R. Jeske, Richard A. Lockhart, M. A. Stephens, Qi Zhang. Cramer-von Mises Tests for the Compatibility of Two Software Operating Environments
64 -- 68Yili Hong, William Q. Meeker, Luis A. Escobar. Avoiding Problems With Normal Approximation Confidence Intervals for Probabilities
69 -- 78K. Krishnamoorthy, Thomas Mathew, Shubhabrata Mukherjee. Normal-Based Methods for a Gamma Distribution - Prediction and Tolerance Intervals and Stress-Strength Reliability
79 -- 85Francesc Carreras, Josep Freixas, María Albina Puente. n Systems
86 -- 0Mário de Castro, Manuel Galea-Rojas, Heleno Bolfarine. Letter to the Editor
87 -- 88Abdulkadir Hussein. Statistical Monitoring of Clinical Trials
88 -- 89Tom Burr. Multidimensional Nonlinear Descriptive Analysis (MUNDA)
88 -- 0Subir Ghosh. Reliability and Risk: A Bayesian Perspective
89 -- 90T. I. Katsaounis. Introductory Statistical Inference
90 -- 91Dean V. Neubauer. Statistical Design of Experiments With Engineering Applications
91 -- 92Melinda Holt. Learning SAS by Example: A Programmer's Guide
91 -- 0Wei-Ming Ke. Probability, Statistics, and Reliability for Engineers and Scientists
92 -- 0Maliha S. Nash. Data Preparation for Analytics Using SAS
92 -- 0David E. Booth. The Cross-Entropy Method
92 -- 93J. Douglas Barrett. Process Control Performance Assessment: From Theoryto Implementation
93 -- 94Donald E. Myers. Linear and Generalized Linear Mixed Models and Their Applications
94 -- 95Hon Keung Tony Ng. Life Cycle Reliability Engineering
94 -- 0Xianggui Qu. The Statistics of Gene Mapping
95 -- 96Dean V. Neubauer. Chemical Process Performance Evaluation
96 -- 97S. E. Ahmed. A Handbook of Statistical Analysis Using Stata
96 -- 0Michael R. Chernick. ® A Practical Guide
97 -- 0S. E. Ahmed. Bayesian Networks and Decision Graphs
97 -- 0S. E. Ahmed. Markov Chain Monte Carlo: Stochastic Simulation for Bayesian Inference
97 -- 98S. E. Ahmed. Univariate and Multivariate General Linear Models - Theory and Applications With SAS