Journal: IEEE T. Instrumentation and Measurement

Volume 53, Issue 6

1449 -- 1454Hana Baili, Gilles Fleury. Indirect measurement within dynamical context: probabilistic approach to deal with uncertainty
1455 -- 1463Frédérique Bicking, Blaise Conrard, Jean-Marc Thiriet. Integration of dependability in a task allocation problem
1464 -- 1472Minsu Choi, Nohpill Park, Vincenzo Piuri, Fabrizio Lombardi. Evaluating the repair of system-on-chip (SoC) using connectivity
1473 -- 1478Xiangyi Fang, David Linton, Chris Walker, Brian Collins. A tunable split resonator method for nondestructive permittivity characterization
1479 -- 1484George C. Giakos, Sankararaman Suryanarayanan, R. Guntupalli, J. Odogba, N. Shah, Srinivasan Vedantham, Samir Chowdhury, K. Mehta, S. Sumrain, N. Patnekar, A. Moholkar, V. Kumar, R. E. Endorf. Detective quantum efficiency [DQE(0)] of CZT semiconductor detectors for digital radiography
1485 -- 1492Jianjun Guo, Waisiu Law, Ward J. Helms, David J. Allstot. Digital calibration for monotonic pipelined A/D converters
1493 -- 1496Chari V. K. Kandala. Moisture determination in single peanut pods by complex RF impedance measurement
1497 -- 1501Olfa Kanoun, Hans-Rolf Trankler. Sensor technology advances and future trends
1502 -- 1509Jeong-Soo Lee, Cam Nguyen, Thomas Scullion. A novel, compact, low-cost, impulse ground-penetrating radar for nondestructive evaluation of pavements
1510 -- 1516San L. Lin, Samiha Mourad. On-chip rise-time measurement
1517 -- 1525Arnaz Malhi, Robert X. Gao. PCA-based feature selection scheme for machine defect classification
1533 -- 1538Mitsuru Shinagawa, Masaaki Fukumoto, Katsuyuki Ochiai, Hakaru Kyuragi. A near-field-sensing transceiver for intrabody communication based on the electrooptic effect
1539 -- 1545Lijun Xu, Jian Qiu Zhang, Yong Yan. A wavelet-based multisensor data fusion algorithm