Journals associated with the name Technometrics:
- Generalized cross-validation as a method for choosing a good ridge parameterG. H. Golub, M. Heath, G.Wahba. Technometrics, 21(2):215-223, 1979.
- Ridge regression: biased estimation for nonorthogonal problemsHoerl, E., Hoerl, E., Kennard, R. W. . Technometrics, :55-67, 1970.