A Genetic Algorithm-Enhanced Sensor Marks Selection Algorithm for Wavefront Aberration Modeling in Extreme-UV (EUV) Photolithography

Aris Magklaras 0001, Panayiotis Alefragis, Christos Gogos, Christos Valouxis, Alexios N. Birbas. A Genetic Algorithm-Enhanced Sensor Marks Selection Algorithm for Wavefront Aberration Modeling in Extreme-UV (EUV) Photolithography. Information, 14(8):428, 2023. [doi]

@article{0001AGVB23,
  title = {A Genetic Algorithm-Enhanced Sensor Marks Selection Algorithm for Wavefront Aberration Modeling in Extreme-UV (EUV) Photolithography},
  author = {Aris Magklaras 0001 and Panayiotis Alefragis and Christos Gogos and Christos Valouxis and Alexios N. Birbas},
  year = {2023},
  doi = {10.3390/info14080428},
  url = {https://doi.org/10.3390/info14080428},
  researchr = {https://researchr.org/publication/0001AGVB23},
  cites = {0},
  citedby = {0},
  journal = {Information},
  volume = {14},
  number = {8},
  pages = {428},
}