Binod Kumar 0001, Kanad Basu, Masahiro Fujita, Virendra Singh. RTL level trace signal selection and coverage estimation during post-silicon validation. In 2017 IEEE International High Level Design Validation and Test Workshop, HLDVT 2017, Santa Cruz, CA, USA, October 5-6, 2017. pages 59-66, IEEE Computer Society, 2017. [doi]
@inproceedings{0001BFS17,
title = {RTL level trace signal selection and coverage estimation during post-silicon validation},
author = {Binod Kumar 0001 and Kanad Basu and Masahiro Fujita and Virendra Singh},
year = {2017},
doi = {10.1109/HLDVT.2017.8167464},
url = {http://doi.ieeecomputersociety.org/10.1109/HLDVT.2017.8167464},
researchr = {https://researchr.org/publication/0001BFS17},
cites = {0},
citedby = {0},
pages = {59-66},
booktitle = {2017 IEEE International High Level Design Validation and Test Workshop, HLDVT 2017, Santa Cruz, CA, USA, October 5-6, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3997-5},
}