Binod Kumar 0001, Kanad Basu, Masahiro Fujita, Virendra Singh. RTL level trace signal selection and coverage estimation during post-silicon validation. In 2017 IEEE International High Level Design Validation and Test Workshop, HLDVT 2017, Santa Cruz, CA, USA, October 5-6, 2017. pages 59-66, IEEE Computer Society, 2017. [doi]
Abstract is missing.