A Technique for Electrical Error Localization with Learning Methods During Post-silicon Debugging

Binod Kumar 0001, Kanad Basu, Virendra Singh. A Technique for Electrical Error Localization with Learning Methods During Post-silicon Debugging. In Ninth International Green and Sustainable Computing Conference, IGSC 2018, Pittsburgh, PA, USA, October 22-24, 2018. pages 1-8, IEEE, 2018. [doi]

Authors

Binod Kumar 0001

This author has not been identified. Look up 'Binod Kumar 0001' in Google

Kanad Basu

This author has not been identified. Look up 'Kanad Basu' in Google

Virendra Singh

This author has not been identified. Look up 'Virendra Singh' in Google