A Technique for Electrical Error Localization with Learning Methods During Post-silicon Debugging

Binod Kumar 0001, Kanad Basu, Virendra Singh. A Technique for Electrical Error Localization with Learning Methods During Post-silicon Debugging. In Ninth International Green and Sustainable Computing Conference, IGSC 2018, Pittsburgh, PA, USA, October 22-24, 2018. pages 1-8, IEEE, 2018. [doi]

@inproceedings{0001BS18-0,
  title = {A Technique for Electrical Error Localization with Learning Methods During Post-silicon Debugging},
  author = {Binod Kumar 0001 and Kanad Basu and Virendra Singh},
  year = {2018},
  doi = {10.1109/IGCC.2018.8752141},
  url = {https://doi.org/10.1109/IGCC.2018.8752141},
  researchr = {https://researchr.org/publication/0001BS18-0},
  cites = {0},
  citedby = {0},
  pages = {1-8},
  booktitle = {Ninth International Green and Sustainable Computing Conference, IGSC 2018, Pittsburgh, PA, USA, October 22-24, 2018},
  publisher = {IEEE},
  isbn = {978-1-5386-7466-6},
}