Jinfu Chen 0001, Jingyi Chen, Saihua Cai, Haibo Chen 0005, Chi Zhang 0046, Chuangfei Huang. A Test Case Generation Method of Combinatorial Testing based on τ-way Testing with Adaptive Random Testing. In IEEE International Symposium on Software Reliability Engineering, ISSRE 2021 - Workshops, Wuhan, China, October 25-28, 2021. pages 83-90, IEEE, 2021. [doi]
Abstract is missing.