Alexander Schaub 0001, Jean-Luc Danger, Olivier Rioul, Sylvain Guilley. The Big Picture of Delay-PUF Dependability. In European Conference on Circuit Theory and Design, ECCTD 2020, Sofia, Bulgaria, September 7-10, 2020. pages 1-4, IEEE, 2020. [doi]
@inproceedings{0001DRG20, title = {The Big Picture of Delay-PUF Dependability}, author = {Alexander Schaub 0001 and Jean-Luc Danger and Olivier Rioul and Sylvain Guilley}, year = {2020}, doi = {10.1109/ECCTD49232.2020.9218396}, url = {https://doi.org/10.1109/ECCTD49232.2020.9218396}, researchr = {https://researchr.org/publication/0001DRG20}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {European Conference on Circuit Theory and Design, ECCTD 2020, Sofia, Bulgaria, September 7-10, 2020}, publisher = {IEEE}, isbn = {978-1-7281-7183-8}, }