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The Big Picture of Delay-PUF Dependability

Alexander Schaub 0001, Jean-Luc Danger, Olivier Rioul, Sylvain Guilley. The Big Picture of Delay-PUF Dependability. In European Conference on Circuit Theory and Design, ECCTD 2020, Sofia, Bulgaria, September 7-10, 2020. pages 1-4, IEEE, 2020. [doi]

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