Chetan Gupta 0001, Ahmed Farahat. Deep Learning for Industrial AI: Challenges, New Methods and Best Practices. In Rajesh Gupta 0001, Yan Liu 0002, Jiliang Tang, B. Aditya Prakash, editors, KDD '20: The 26th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, Virtual Event, CA, USA, August 23-27, 2020. pages 3571-3572, ACM, 2020. [doi]
@inproceedings{0001F20-0,
title = {Deep Learning for Industrial AI: Challenges, New Methods and Best Practices},
author = {Chetan Gupta 0001 and Ahmed Farahat},
year = {2020},
url = {https://dl.acm.org/doi/10.1145/3394486.3406482},
researchr = {https://researchr.org/publication/0001F20-0},
cites = {0},
citedby = {0},
pages = {3571-3572},
booktitle = {KDD '20: The 26th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, Virtual Event, CA, USA, August 23-27, 2020},
editor = {Rajesh Gupta 0001 and Yan Liu 0002 and Jiliang Tang and B. Aditya Prakash},
publisher = {ACM},
isbn = {978-1-4503-7998-4},
}