The Subgraph Testing Model

Oded Goldreich 0001, Dana Ron. The Subgraph Testing Model. In Avrim Blum, editor, 10th Innovations in Theoretical Computer Science Conference, ITCS 2019, January 10-12, 2019, San Diego, California, USA. Volume 124 of LIPIcs, Schloss Dagstuhl - Leibniz-Zentrum fuer Informatik, 2019. [doi]

Authors

Oded Goldreich 0001

This author has not been identified. Look up 'Oded Goldreich 0001' in Google

Dana Ron

This author has not been identified. Look up 'Dana Ron' in Google