The Subgraph Testing Model

Oded Goldreich 0001, Dana Ron. The Subgraph Testing Model. In Avrim Blum, editor, 10th Innovations in Theoretical Computer Science Conference, ITCS 2019, January 10-12, 2019, San Diego, California, USA. Volume 124 of LIPIcs, Schloss Dagstuhl - Leibniz-Zentrum fuer Informatik, 2019. [doi]

Abstract

Abstract is missing.