Contourlet and Nearest Feature Line Based Feature Extraction Approach for One Prototype Sample Problem

Jeng-Shyang Pan 0001, Lijun Yan, Shu-Chuan Chu, John F. Roddick. Contourlet and Nearest Feature Line Based Feature Extraction Approach for One Prototype Sample Problem. J. Inf. Hiding Multim. Signal Process., 7(5):1052-1059, 2016. [doi]

Abstract

Abstract is missing.