Cuong Nguyen 0001, Hiroaki Yoshida, Mukul R. Prasad, Indradeep Ghosh, Koushik Sen. Generating Succinct Test Cases Using Don't Care Analysis. In 8th IEEE International Conference on Software Testing, Verification and Validation, ICST 2015, Graz, Austria, April 13-17, 2015. pages 1-10, IEEE, 2015. [doi]
Abstract is missing.