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Greedy combinatorial test case generation using unsatisfiable cores

Akihisa Yamada 0002, Armin Biere, Cyrille Artho, Takashi Kitamura, Eun-Hye Choi. Greedy combinatorial test case generation using unsatisfiable cores. In David Lo, Sven Apel, Sarfraz Khurshid, editors, Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering. pages 614-624, ACM, 2016. [doi]

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Akihisa Yamada 0002

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Armin Biere

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Cyrille Artho

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Takashi Kitamura

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Eun-Hye Choi

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