Greedy combinatorial test case generation using unsatisfiable cores

Akihisa Yamada 0002, Armin Biere, Cyrille Artho, Takashi Kitamura, Eun-Hye Choi. Greedy combinatorial test case generation using unsatisfiable cores. In David Lo, Sven Apel, Sarfraz Khurshid, editors, Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering. pages 614-624, ACM, 2016. [doi]

@inproceedings{0002BAKC16,
  title = {Greedy combinatorial test case generation using unsatisfiable cores},
  author = {Akihisa Yamada 0002 and Armin Biere and Cyrille Artho and Takashi Kitamura and Eun-Hye Choi},
  year = {2016},
  doi = {10.1145/2970276.2970335},
  url = {http://doi.acm.org/10.1145/2970276.2970335},
  researchr = {https://researchr.org/publication/0002BAKC16},
  cites = {0},
  citedby = {0},
  pages = {614-624},
  booktitle = {Proceedings of the 31st IEEE/ACM International Conference on Automated Software Engineering},
  editor = {David Lo and Sven Apel and Sarfraz Khurshid},
  publisher = {ACM},
  isbn = {978-1-4503-3845-5},
}